WaveRunner Xi Series Oscilloscope

WaveRunner 204MXi, WaveRunner 104MXi, WaveRunner 64MXi, WaveRunner 44MXi, WaveRunner 204Xi, WaveRunner 104Xi, WaveRunner 64Xi, WaveRunner 62Xi, WaveRunner 44Xi

Quick Specs
  • - 400 MHz to 2 GHz Bandwidth
  • - up to 10 GS/s
  • - 12.5 Mpts/Ch standard memory
  • - Big 10.4" LCD Display
  • - Small 6" footprint
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Unmatched Measurement and Validation Capability

WaveRunner Xi provides the highest value for everyday characterization, validation, and debug, and the best capability for quickly debugging advanced problems. Whether you are debugging circuits with a mix of slow- and high-speed signals, performing signal integrity checks on high-speed clock and data signals, or doing advanced debugging of complex problems, WaveRunner Xi has the right toolset that is easily applied to the problem.

Oftentimes, only viewing signals does not provide the level of precision that is required for validating designs. At those times, the ability of WaveRunner Xi to quickly provide precise statistical data becomes vital. With WaveRunner Xi, you can quickly accumulate data on thousands of measurements in a single shot (WaveRunner Xi does not limit its measurements to a single value in an acquisition) or in multiple acquisitions. Touch a button, and display statistical information. Touch another button to display a Histicon graphical view of the measurement distribution. Expand this view into a larger histogram of measurement data. Accumulate up to 2 billion measurement events, or create measurable persistence traces of signals with the optional WRXi-STAT.

Advanced Math Characterization

Most oscilloscopes contain only a few simple math functions to subtract waveforms or to perform coarse resolution FFTs on short record length acquisitions. Or, they provide long memory, but limited ability to process the memory and perform WaveShape Analysis that leads to detailed understanding and faster debug. WaveRunner Xi oscilloscopes contain dozens of standard math functions, and powerful capabilities, such as long memory FFTs, Trending, Tracking (optional), Sparsing, Interpolation selection, a variety of Persistence Views, user customized math and measurements (MATLAB, or Visual Basic formats), and numerous other specialized capabilities (optional Application Packages). The toolset is rich and deep, and sure to solve any complex problem.

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